Highly focused femtosecond laser directed selective boron doping in single SiC nanowire device for n-p conversion
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Huo, Jinpeng
ORCID
Department of Mechanical Engineering, State Key Laboratory of Tribology, Key Laboratory for Advanced Manufacturing by Materials Processing Technology, Ministry of Education of PR China, Tsinghua University, Beijing 100084, People's Republic of China
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Zou, Guisheng
Department of Mechanical Engineering, State Key Laboratory of Tribology, Key Laboratory for Advanced Manufacturing by Materials Processing Technology, Ministry of Education of PR China, Tsinghua University, Beijing 100084, People's Republic of China
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Lin, Luchan
Empa, Swiss Federal Laboratories for Materials Science and Technology, Überlandstrasse 129, 8600 Dübendorf, Switzerland
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Wang, Kehong
School of Material Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
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Xing, Songling
ORCID
Department of Mechanical Engineering, State Key Laboratory of Tribology, Key Laboratory for Advanced Manufacturing by Materials Processing Technology, Ministry of Education of PR China, Tsinghua University, Beijing 100084, People's Republic of China
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Zhao, Guanlei
Department of Mechanical Engineering, State Key Laboratory of Tribology, Key Laboratory for Advanced Manufacturing by Materials Processing Technology, Ministry of Education of PR China, Tsinghua University, Beijing 100084, People's Republic of China
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Liu, Lei
ORCID
Department of Mechanical Engineering, State Key Laboratory of Tribology, Key Laboratory for Advanced Manufacturing by Materials Processing Technology, Ministry of Education of PR China, Tsinghua University, Beijing 100084, People's Republic of China
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Norman Zhou, Y.
Centre for Advanced Materials Joining, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
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Published in:
- Applied Physics Letters. - AIP Publishing. - 2019, vol. 115, no. 13, p. 133104
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Language
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Open access status
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green
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Identifiers
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Persistent URL
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https://sonar.ch/global/documents/139552
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