Structured illumination in total internal reflection fluorescence microscopy using a spatial light modulator.

Fiolka R; Beck M; Stemmer A

doi:10.1364/ol.33.001629

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Journal article

Structured illumination in total internal reflection fluorescence microscopy using a spatial light modulator.

Fiolka R Department of Mechanical and Process Engineering, ETH Zurich, Zurich, Switzerland.
Beck M
Stemmer A

2008-07-17

Published in:

Optics letters. - 2008

Atomic and Molecular Physics, and Optics

English In wide-field fluorescence microscopy, illuminating the specimen with evanescent standing waves increases lateral resolution more than twofold. We report a versatile setup for standing-wave illumination in total internal reflection fluorescence microscopy. An adjustable diffraction grating written on a phase-only spatial light modulator controls the illumination field. Selecting appropriate diffraction orders and displaying a sheared (tilted) diffraction grating allows one to tune the penetration depth in very fine steps. The setup achieves 91 nm lateral resolution for green emission.

Language

English

Open access status

closed

Identifiers

DOI 10.1364/ol.33.001629
PMID 18628820

Persistent URL

https://sonar.ch/global/documents/123667

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