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Sub-100-nanometre resolution in total internal reflection fluorescence microscopy.
Journal article

Sub-100-nanometre resolution in total internal reflection fluorescence microscopy.

  • Beck M Nanotechnology Group, Department of Mechanical and Process Engineering, ETH Zurich, Tannenstrasse 3, 8092 Zurich, Switzerland.
  • Aschwanden M
  • Stemmer A
  • 2008-11-20
Published in:
  • Journal of microscopy. - 2008
Pathology and Forensic Medicine
Histology
English Combining total internal reflection fluorescence microscopy with structured illumination allows optical wide-field imaging with sub-100-nanometre resolution. We present a novel objective-launch set-up for standing wave illumination that takes advantage of a tunable transmission diffraction grating and transparent phase shifters actuated by electro-active polymers to control the excitation pattern in three dimensions. Image acquisition is completed in less than 1 s. To reconstruct the extended image spectrum, we apply a new apodization function that results in a lateral resolution of 89 nm for green emission wavelength.
Language
  • English
Open access status
closed
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Persistent URL
https://sonar.ch/global/documents/123682
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