Interplay between bulk and edge-bound topological defects in a square micromagnet
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Sloetjes, Sam D.
Department of Electronic Systems, Norwegian University of Science and Technology, NO-7491 Trondheim, Norway
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Digernes, Einar
Department of Electronic Systems, Norwegian University of Science and Technology, NO-7491 Trondheim, Norway
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Olsen, Fredrik K.
Department of Electronic Systems, Norwegian University of Science and Technology, NO-7491 Trondheim, Norway
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Chopdekar, Rajesh V.
ORCID
Department of Materials Science and Engineering, University of California, Davis, California 95616, USA
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Retterer, Scott T.
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
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Folven, Erik
Department of Electronic Systems, Norwegian University of Science and Technology, NO-7491 Trondheim, Norway
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Grepstad, Jostein K.
Department of Electronic Systems, Norwegian University of Science and Technology, NO-7491 Trondheim, Norway
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Published in:
- Applied Physics Letters. - AIP Publishing. - 2018, vol. 112, no. 4, p. 042401
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Language
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Open access status
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hybrid
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Identifiers
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Persistent URL
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https://sonar.ch/global/documents/139469
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