Author Correction: Record thermopower found in an IrMn-based spintronic stack.

• Tu S Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.
• Ziman T Institut Laue-Langevin, 38042, Grenoble, France.
• Yu G Department of Electrical Engineering, University of California, Los Angeles, CA, 90095, USA.
• Wan C Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 100190, Beijing, China.
• Hu J Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.
• Wu H Department of Electrical Engineering, University of California, Los Angeles, CA, 90095, USA.
• Wang H Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.
• Liu M Electron Microscopy Laboratory, School of Physics, Peking University, 100871, Beijing, China.
• Liu C Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.
• Guo C Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 100190, Beijing, China.
• Zhang J Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.
• Cabero Z MA Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.
• Zhang Y Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China.
• Gao P Electron Microscopy Laboratory, School of Physics, Peking University, 100871, Beijing, China.
• Liu S Shenzhen Institute for Quantum Science and Engineering (SIQSE), and Department of Physics, Southern University of Science and Technology (SUSTech), 518055, Shenzhen, China.
• Yu D Electron Microscopy Laboratory, School of Physics, Peking University, 100871, Beijing, China.
• Han X Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, University of Chinese Academy of Sciences, Chinese Academy of Sciences, 100190, Beijing, China.
• Hallsteinsen I Department of Electronic Systems, Norwegian University of Science and Technology, Trondheim, 7491, Norway.
• Gilbert DA Material Science and Engineering Department, University of Tennessee, Knoxville, TN, 37996, USA.
• Matsuo M Kavli Institute for Theoretical Sciences, University of Chinese Academy of Sciences, 100190, Beijing, China.
• Ohnuma Y Kavli Institute for Theoretical Sciences, University of Chinese Academy of Sciences, 100190, Beijing, China.
• Wölfle P Institute for Theory of Condensed Matter, Karlsruhe Institute of Technology, 76049, Karlsruhe, Germany.
• Wang KL Department of Electrical Engineering, University of California, Los Angeles, CA, 90095, USA.
• Ansermet JP Institute of Physics, Ecole Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland.
• Maekawa S Kavli Institute for Theoretical Sciences, University of Chinese Academy of Sciences, 100190, Beijing, China.
• Yu H Fert Beijing Institute, BDBC, School of Microelectronics, Beihang University, 100191, Beijing, China. haiming.yu@buaa.edu.cn.

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General Chemistry