Dielectric Spectroscopy of Pressurized Saccharomyces cerevisiae.
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Starzonek S
Institute of Physics & Silesian Intercollegiate Center for Education and Interdisciplinary Research, University of Silesia, ul. 75 Pułku Piechoty 1A, 41-500 Chorzów, Poland.
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Rutkowska M
Institute of High Pressure Physics, Polish Academy of Sciences, ul. Sokołowska 27/39, 01-142 Warsaw, Poland.
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Rzoska SJ
Institute of Physics & Silesian Intercollegiate Center for Education and Interdisciplinary Research, University of Silesia, ul. 75 Pułku Piechoty 1A, 41-500 Chorzów, Poland ; Institute of High Pressure Physics, Polish Academy of Sciences, ul. Sokołowska 27/39, 01-142 Warsaw, Poland.
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Drozd-Rzoska A
Institute of High Pressure Physics, Polish Academy of Sciences, ul. Sokołowska 27/39, 01-142 Warsaw, Poland.
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Fonberg-Broczek M
Institute of High Pressure Physics, Polish Academy of Sciences, ul. Sokołowska 27/39, 01-142 Warsaw, Poland.
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Sokołowska B
Prof. Wacław Dąbrowski Institute of Agricultural and Food Biotechnology, Departmentof Fruit and Vegetable Product Technology, ul. Rakowiecka 36, 02-532 Warsaw, Poland.
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Martinez-Garcia JC
University of Berne, Freiestrasse 3, Berne, CH-3012 Switzerland.
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English
Results of broadband dielectric spectroscopy (BDS) in Saccharomyces cerevisiae (baker's yeast), in situ as the function of pressure are presented. They show a clear evidence of a threshold to the new pattern of the pressure evolution of the static dielectric permittivity and DC electric conductivity already for Pt ≈ 200MPa at T = 5 oC and Pt ≈ 300MPa at T = 25 oC. BDS monitoring versus pressure tests up to P = 400MPa revealed particularly notable changes of properties after 30 minutes of compressing. Finally, the correlation between the amount of the spectrophotometric maximum absorbance and the DC electric conductivity was found. All these indicate significance of BDS as the tool for testing of pressure properties of cells assemblies, model foods etc., in situ under high pressures.
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Language
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Open access status
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hybrid
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Persistent URL
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https://sonar.ch/global/documents/164413
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