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Journal article

Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air.

  • Beyer H Nanotechnology Group, ETH Zürich, Säumerstrasse 4, 8803 Rüschlikon, Switzerland.
  • Wagner T Nanotechnology Group, ETH Zürich, Säumerstrasse 4, 8803 Rüschlikon, Switzerland.
  • Stemmer A Nanotechnology Group, ETH Zürich, Säumerstrasse 4, 8803 Rüschlikon, Switzerland.
  • 2016-06-24
Published in:
  • Beilstein journal of nanotechnology. - 2016
ambient conditions
drift compensation
frequency-modulation atomic force microscopy
high-resolution
length-extension resonator
English Frequency-modulation atomic force microscopy has turned into a well-established method to obtain atomic resolution on flat surfaces, but is often limited to ultra-high vacuum conditions and cryogenic temperatures. Measurements under ambient conditions are influenced by variations of the dew point and thin water layers present on practically every surface, complicating stable imaging with high resolution. We demonstrate high-resolution imaging in air using a length-extension resonator operating at small amplitudes. An additional slow feedback compensates for changes in the free resonance frequency, allowing stable imaging over a long period of time with changing environmental conditions.
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  • English
Open access status
gold
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https://sonar.ch/global/documents/185449
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