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In situphotoelectron spectroscopic characterization of reactively sputtered, doped vanadium oxide thin films
Journal article

In situphotoelectron spectroscopic characterization of reactively sputtered, doped vanadium oxide thin films

  • Krammer, A. Solar Energy and Building Physics Laboratory (LESO-PB); EPFL; 1015 Lausanne Switzerland
  • Gremaud, A. Solar Energy and Building Physics Laboratory (LESO-PB); EPFL; 1015 Lausanne Switzerland
  • Bouvard, O. Solar Energy and Building Physics Laboratory (LESO-PB); EPFL; 1015 Lausanne Switzerland
  • Sanjines, R. Laboratory of Physics of Complex Matter (LPMC); EPFL; 1015 Lausanne Switzerland
  • Schüler, A. Solar Energy and Building Physics Laboratory (LESO-PB); EPFL; 1015 Lausanne Switzerland
  • 2016-3-10
Published in:
  • Surface and Interface Analysis. - Wiley. - 2016, vol. 48, no. 7, p. 440-444
Language
  • English
Open access status
closed
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Persistent URL
https://sonar.ch/global/documents/20696
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