Journal article
Improved control of septoria tritici blotch in durum wheat using cultivar mixtures
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Ben M'Barek, Sarrah
ORCID
CRP Wheat Septoria Precision Phenotyping Platform Tunis Tunisia
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Karisto, Petteri
ORCID
Department of Evolutionary Biology and Environmental Studies University of Zurich Zurich Switzerland
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Abdedayem, Wided
University of CarthageNational Agronomic Institute of Tunisia (INAT) Tunis Tunisia
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Laribi, Marwa
University of CarthageNational Agronomic Institute of Tunisia (INAT) Tunis Tunisia
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Fakhfakh, Moez
Comptoir Multiservices Agricoles Tunis Belvedre, Tunis Tunisia
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Kouki, Hajer
CRP Wheat Septoria Precision Phenotyping Platform Tunis Tunisia
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Mikaberidze, Alexey
ORCID
School of Agriculture, Policy and Development University of Reading Whiteknights, Reading UK
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Yahyaoui, Amor
International Maize and Wheat Improvement Center (CIMMYT) km 45 Carretera México‐Veracruz, El Batan Texcoco Mexico
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Published in:
- Plant Pathology. - Wiley. - 2020, vol. 69, no. 9, p. 1655-1665
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Language
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Open access status
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green
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Identifiers
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Persistent URL
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https://sonar.ch/global/documents/22861
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