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Focus: The interface between data collection and data processing in cryo-EM.
Journal article

Focus: The interface between data collection and data processing in cryo-EM.

  • Biyani N Center for Cellular Imaging and NanoAnalytics (C-CINA), Biozentrum, University of Basel, Basel, Switzerland.
  • Righetto RD Center for Cellular Imaging and NanoAnalytics (C-CINA), Biozentrum, University of Basel, Basel, Switzerland.
  • McLeod R Center for Cellular Imaging and NanoAnalytics (C-CINA), Biozentrum, University of Basel, Basel, Switzerland.
  • Caujolle-Bert D BioEM Lab, C-CINA, Biozentrum, University of Basel, Basel, Switzerland.
  • Castano-Diez D BioEM Lab, C-CINA, Biozentrum, University of Basel, Basel, Switzerland.
  • Goldie KN Center for Cellular Imaging and NanoAnalytics (C-CINA), Biozentrum, University of Basel, Basel, Switzerland.
  • Stahlberg H Center for Cellular Imaging and NanoAnalytics (C-CINA), Biozentrum, University of Basel, Basel, Switzerland. Electronic address: henning.stahlberg@unibas.ch.
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  • 2017-03-28
Published in:
  • Journal of structural biology. - 2017
Automated data collection
Cryo-EM
Drift correction
High throughput image processing
Automation
Cryoelectron Microscopy
Image Processing, Computer-Assisted
Signal-To-Noise Ratio
Software
User-Computer Interface
English We present a new software package called Focus that interfaces cryo-transmission electron microscopy (cryo-EM) data collection with computer image processing. Focus creates a user-friendly environment to import and manage data recorded by direct electron detectors and perform elemental image processing tasks in a high-throughput manner while new data is being acquired at the microscope. It provides the functionality required to remotely monitor the progress of data collection and data processing, which is essential now that automation in cryo-EM allows a steady flow of images of single particles, two-dimensional crystals, or electron tomography data to be recorded in overnight sessions. The rapid detection of any errors that may occur greatly increases the productivity of recording sessions at the electron microscope.
Language
  • English
Open access status
hybrid
Identifiers
Persistent URL
https://sonar.ch/global/documents/232378
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