Journal article
Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system.
- Pilet N Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland. nicolas.pilet@psi.ch
- Raabe J
- Stevenson SE
- Romer S
- Bernard L
- McNeill CR
- Fink RH
- Hug HJ
- Quitmann C
- 2012-11-03
Published in:
- Nanotechnology. - 2012
English
A combined x-ray transmission and scanning force microscope setup (NanoXAS) recently installed at a dedicated beamline of the Swiss Light Source combines complementary experimental techniques to access chemical and physical sample properties with nanometer scale resolution. While scanning force microscopy probes physical properties such as sample topography, local mechanical properties, adhesion, electric and magnetic properties on lateral scales even down to atomic resolution, scanning transmission x-ray microscopy offers direct access to the local chemical composition, electronic structure and magnetization. Here we present three studies which underline the advantages of complementary access to nanoscale properties in prototype thin film samples.
- Language
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- English
- Open access status
- closed
- Identifiers
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- DOI 10.1088/0957-4484/23/47/475708
- PMID 23117254
- Persistent URL
- https://sonar.ch/global/documents/239417
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