Journal article

Wavefront sensing at X-ray free-electron lasers.

  • Seaberg M Linac Coherent Light Source, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
  • Cojocaru R European Synchrotron Radiation Facility, CS 40220, F-38043 Grenoble Cedex 9, France.
  • Berujon S European Synchrotron Radiation Facility, CS 40220, F-38043 Grenoble Cedex 9, France.
  • Ziegler E European Synchrotron Radiation Facility, CS 40220, F-38043 Grenoble Cedex 9, France.
  • Jaggi A Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
  • Krempasky J Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
  • Seiboth F Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, D-22607 Hamburg, Germany.
  • Aquila A Linac Coherent Light Source, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
  • Liu Y Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
  • Sakdinawat A Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
  • Lee HJ Linac Coherent Light Source, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
  • Flechsig U Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
  • Patthey L Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
  • Koch F Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
  • Seniutinas G Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
  • David C Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.
  • Zhu D Linac Coherent Light Source, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA.
  • Mikeš L European XFEL GmbH, Holzkoppel 4, 22869 Schenefeld, Germany.
  • Makita M European XFEL GmbH, Holzkoppel 4, 22869 Schenefeld, Germany.
  • Koyama T RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan.
  • Mancuso AP European XFEL GmbH, Holzkoppel 4, 22869 Schenefeld, Germany.
  • Chapman HN Center for Free-Electron Laser Science, DESY, Notkestraße 85, 22607 Hamburg, Germany.
  • Vagovič P European XFEL GmbH, Holzkoppel 4, 22869 Schenefeld, Germany.
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  • 2019-07-06
Published in:
  • Journal of synchrotron radiation. - 2019
English Here a direct comparison is made between various X-ray wavefront sensing methods with application to optics alignment and focus characterization at X-ray free-electron lasers (XFELs). Focus optimization at XFEL beamlines presents unique challenges due to high peak powers as well as beam pointing instability, meaning that techniques capable of single-shot measurement and that probe the wavefront at an out-of-focus location are desirable. The techniques chosen for the comparison include single-phase-grating Talbot interferometry (shearing interferometry), dual-grating Talbot interferometry (moiré deflectometry) and speckle tracking. All three methods were implemented during a single beam time at the Linac Coherent Light Source, at the X-ray Pump Probe beamline, in order to make a direct comparison. Each method was used to characterize the wavefront resulting from a stack of beryllium compound refractive lenses followed by a corrective phase plate. In addition, difference wavefront measurements with and without the phase plate agreed with its design to within λ/20, which enabled a direct quantitative comparison between methods. Finally, a path toward automated alignment at XFEL beamlines using a wavefront sensor to close the loop is presented.
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  • English
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hybrid
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https://sonar.ch/global/documents/239622
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