Journal article
Nanoscale Imaging of Charge Carrier and Exciton Trapping at Structural Defects in Organic Semiconductors
- Große, Christoph Max-Planck-Institut für Festkörperforschung, Heisenbergstraße 1, 70569 Stuttgart, Germany
- Gunnarsson, Olle Max-Planck-Institut für Festkörperforschung, Heisenbergstraße 1, 70569 Stuttgart, Germany
- Merino, Pablo Max-Planck-Institut für Festkörperforschung, Heisenbergstraße 1, 70569 Stuttgart, Germany
- Kuhnke, Klaus Max-Planck-Institut für Festkörperforschung, Heisenbergstraße 1, 70569 Stuttgart, Germany
- Kern, Klaus École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
- 2016-2-19
Published in:
- Nano Letters. - American Chemical Society (ACS). - 2016, vol. 16, no. 3, p. 2084-2089
Mechanical Engineering
General Materials Science
Bioengineering
General Chemistry
Condensed Matter Physics
- Language
-
- English
- Open access status
- closed
- Identifiers
-
- DOI 10.1021/acs.nanolett.6b00190
- ISSN 1530-6984
- Persistent URL
- https://sonar.ch/global/documents/282466
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