Journal article
Limitations of interferometry due to the flicker noise of laser diodes
- Salvade Y Institute of Microtechnology, University of Neuchatel, Switzerland. yves.salvade@imt.unine.ch
- Dandliker R
- 2000-05-05
Published in:
- Journal of the Optical Society of America. A, Optics, image science, and vision. - 2000
English
Interferometry with laser diodes is a cost-effective way to perform displacement measurement. The tunability of laser diodes is also of great interest in multiple-wavelength interferometry. However, the additional flicker noise in the frequency-noise spectrum of semiconductor lasers may become a limiting factor. Investigations on the limitations due to the 1/f noise of laser diodes are presented for both classical and multiple-wavelength interferometry. Measurements at the limit of the coherence length of laser diodes with the corresponding phase fluctuations are reported. The theoretical results are verified experimentally.
- Language
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- English
- Open access status
- closed
- Identifiers
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- DOI 10.1364/josaa.17.000927
- PMID 10795642
- Persistent URL
- https://sonar.ch/global/documents/601
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