Surface Defect Passivation of Silicon Micropillars
- Mikulik, Dmitry ORCID Laboratory of Semiconductor Materials; Institute of Materials; Ecole Polytechnique Fédérale de Lausanne; Lausanne 1015 Switzerland
- Meng, Andrew C. ORCID Department of Materials Science and Engineering; Stanford University; Stanford CA 94305 USA
- Berrazouane, Riad Laboratory of Semiconductor Materials; Institute of Materials; Ecole Polytechnique Fédérale de Lausanne; Lausanne 1015 Switzerland
- Stückelberger, Josua ORCID Photovoltaics and Thin Film Electronics Laboratory; Institute of Microengineering; Ecole Polytechnique Fédérale de Lausanne; Neuchâtel 2000 Switzerland
- Romero-Gomez, Pablo ORCID Laboratory of Semiconductor Materials; Institute of Materials; Ecole Polytechnique Fédérale de Lausanne; Lausanne 1015 Switzerland
- Tang, Kechao ORCID Department of Materials Science and Engineering; Stanford University; Stanford CA 94305 USA
- Haug, Franz-Josef Photovoltaics and Thin Film Electronics Laboratory; Institute of Microengineering; Ecole Polytechnique Fédérale de Lausanne; Neuchâtel 2000 Switzerland
- Fontcuberta i Morral, Anna ORCID Laboratory of Semiconductor Materials; Institute of Materials; Ecole Polytechnique Fédérale de Lausanne; Lausanne 1015 Switzerland
- McIntyre, Paul C. Department of Materials Science and Engineering; Stanford University; Stanford CA 94305 USA
- 2018-8-15
Published in:
- Advanced Materials Interfaces. - Wiley. - 2018, vol. 5, no. 20, p. 1800865
- Language
-
- English
- Open access status
- hybrid
- Identifiers
-
- DOI 10.1002/admi.201800865
- ISSN 2196-7350
- Persistent URL
- https://sonar.ch/global/documents/80529
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