Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation
- Luo, Yixin Carnegie Mellon University, Pittsburgh, PA, USA
- Ghose, Saugata Carnegie Mellon University, Pittsburgh, PA, USA
- Cai, Yu Carnegie Mellon University, San Jose, CA, USA
- Haratsch, Erich F. Seagate Technology, Fremont, CA, USA
- Mutlu, Onur ETH Zürich & Carnegie Mellon University, Zürich, Switzerland
- 2018-6-18
Published in:
- Abstracts of the 2018 ACM International Conference on Measurement and Modeling of Computer Systems. - ACM. - 2018
- Language
-
- English
- Open access status
- green
- Identifiers
- Persistent URL
- https://sonar.ch/global/documents/82259
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