Advanced atomic force microscopy techniques.
- Glatzel T Department of Physics, University of Basel, Klingelbergstr. 82, 4056 Basel, Switzerland.
- Hölscher H
- Schimmel T
- Baykara MZ
- Schwarz UD
- Garcia R
- 2013-02-01
Published in:
- Beilstein journal of nanotechnology. - 2012
- Language
-
- English
- Open access status
- gold
- Identifiers
-
- DOI 10.3762/bjnano.3.99
- PMID 23365802
- Persistent URL
- https://sonar.ch/global/documents/90977
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