In situ study of the degradation phenomena induced by lithiation/delithiation cycle of a composite Si-based anode by the mean of X-ray tomography
Journal article

In situ study of the degradation phenomena induced by lithiation/delithiation cycle of a composite Si-based anode by the mean of X-ray tomography

  • 2016-12-20
Published in:
  • European Microscopy Congress 2016: Proceedings. - Wiley-VCH Verlag GmbH & Co. KGaA. - 2016, p. 816-817
Language
  • English
Open access status
closed
Identifiers
Persistent URL
https://sonar.ch/global/documents/93169
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