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Capacitance‐voltage profiling of quantum well structures
Journal article

Capacitance‐voltage profiling of quantum well structures

  • Tschirner, B. M. Institut de micro‐et optoélectronique, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
  • Morier‐Genoud, F. Institut de micro‐et optoélectronique, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
  • Martin, D. Institut de micro‐et optoélectronique, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
  • Reinhart, F. K. Institut de micro‐et optoélectronique, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland
Published in:
  • Journal of Applied Physics. - AIP Publishing. - 1996, vol. 79, no. 9, p. 7005-7013
General Physics and Astronomy
Language
  • English
Open access status
closed
Identifiers
Persistent URL
https://sonar.ch/global/documents/95847
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