Journal article
Spectral data of specular reflectance, narrow-angle transmittance and angle-resolved surface scattering of materials for solar concentrators.
- Good P Department of Mechanical and Process Engineering, ETH Zurich, 8092 Zurich, Switzerland.
- Cooper T Department of Mechanical and Process Engineering, ETH Zurich, 8092 Zurich, Switzerland.
- Querci M Department of Mechanical and Process Engineering, ETH Zurich, 8092 Zurich, Switzerland.
- Wiik N Department of Mechanical and Process Engineering, ETH Zurich, 8092 Zurich, Switzerland.
- Ambrosetti G Airlight Energy Manufacturing SA, 6710 Biasca, Switzerland.
- Steinfeld A Department of Mechanical and Process Engineering, ETH Zurich, 8092 Zurich, Switzerland.
- 2016-02-11
Published in:
- Data in brief. - 2016
English
The spectral specular reflectance of conventional and novel reflective materials for solar concentrators is measured with an acceptance angle of 17.5 mrad over the wavelength range 300-2500 nm at incidence angles 15-60° using a spectroscopic goniometry system. The same experimental setup is used to determine the spectral narrow-angle transmittance of semi-transparent materials for solar collector covers at incidence angles 0-60°. In addition, the angle-resolved surface scattering of reflective materials is recorded by an area-scan CCD detector over the spectral range 350-1050 nm. A comprehensive summary, discussion, and interpretation of the results are included in the associated research article "Spectral reflectance, transmittance, and angular scattering of materials for solar concentrators" in Solar Energy Materials and Solar Cells.
- Language
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- English
- Open access status
- gold
- Identifiers
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- DOI 10.1016/j.dib.2015.11.059
- PMID 26862556
- Persistent URL
- https://sonar.ch/global/documents/99601
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