Crystallographic orientation assessment by electron backscattered diffraction.
- Cléton F CIME, Ecole Polytechnique Fédérale de Lausanne, Switzerland.
- Jouneau PH
- Henry S
- Gäumann M
- Buffat PA
- 1999-09-14
Published in:
- Scanning. - 1999
Algorithms
Alloys
Crystallography
Electrons
Lasers
Microscopy, Electron, Scanning
Nickel
Scattering, Radiation
Software
English
With an angular orientation accuracy of at least 1 , the ability of electron backscattered diffraction (EBSD) to determine and emphasise crystallographic orientation is illustrated. Using the abilities of specially developed software for computing Euler angles derived from the scanned specimen, misorientations are pointed out with acceptable flexibility and graphic output through crystallographic orientation maps or pole figures. This ability is displayed in the particular case of laser cladding of nickel-based superalloy, a process that combines the advantages of a near net-shape manufacturing and a close control of the solidification microstructure (E-LMF: epitaxial laser metal forming).
- Language
-
- English
- Open access status
- bronze
- Identifiers
-
- DOI 10.1002/sca.4950210402
- PMID 10483877
- Persistent URL
- https://sonar.ch/global/documents/14026
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